Analysis and characterization of surface defects on thin steel wires by atomic force microscopy
- Sanchez-Brea, LM
- Gomez-Pedrero, JA
- Bernabeu, E
ISBN: *************
Datum der Publikation: 1998
Seiten: 189-192
Kongress: Wire and Cable Technical Symposium (WCTS) at the 69th Annual Convention of the Wire-Association-International
Art: Konferenz-Beitrag