Impurity segregation in Al doped GaSb studied by cathodoluminescence microscopy

  1. Hidalgo, P
  2. Mendez, B
  3. Piqueras, J
  4. Dutta, PS
Book Series:
DEFECT AND IMPURITY ENGINEERED SEMICONDUCTORS II
  1. Ashok, S (coord.)
  2. Chevallier, J (coord.)
  3. Sumino, K (coord.)
  4. Sopori, BL (coord.)
  5. Gotz, W (coord.)

ISSN: 0272-9172

ISBN: 1-55899-416-5

Year of publication: 1998

Volume: 510

Pages: 639-644

Congress: Symposium on Defect and Impurity Engineered Semiconductors II at the Materials-Research-Society Spring Meeting

Type: Conference paper

DOI: 10.1557/PROC-510-639 GOOGLE SCHOLAR
Data source: WoS