INFLUENCE OF DEFECTS ON DIFFUSION LENGTH INHOMOGENEITY IN GAAS-TE WAFERS

  1. CASTALDINI, A
  2. CAVALLINI, A
  3. FRABONI, B
  4. MENDEZ, B
  5. PIQUERAS, J
Book Series:
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS AND DEVICES
  1. Jimenez, J (coord.)

ISSN: 0951-3248

ISBN: 0-7503-0294-1

Year of publication: 1994

Pages: 207-210

Congress: 5th International Conference on Defect Recognition and Image Processing in Semiconductors and Devices

Type: Conference paper

GOOGLE SCHOLAR
Data source: WoS