Investigation of deep energy levels in II-VI compounds

  1. Castaldini, A
  2. Cavallini, A
  3. Fernandez, P
  4. Fraboni, B
  5. Piqueras, J
Book Series:
DEFECTS IN ELECTRONIC MATERIALS II
  1. Michel, J (coord.)
  2. Kennedy, T (coord.)
  3. Wada, K (coord.)
  4. Thonke, K (coord.)

ISSN: 0272-9172

ISBN: 1-55899-346-0

Year of publication: 1997

Volume: 442

Pages: 605-610

Congress: Symposium on Defects in Electronic Materials II, at the Combined Meeting of the Materials-Research-Society / International Conference on Electronic Materials

Type: Conference paper

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Data source: WoS