A comprehensive model to accurately calculate the gate capacitance and the leakage from DC to 100 MHz for ultra thin dielectrics

  1. Pantisano, L.
  2. Ramos, J.
  3. Serrano, E. San Andres
  4. Roussel, Ph. J.
  5. Sansen, W.
  6. Groeseneken, G.
Libro:
ICMTS 2006: PROCEEDINGS OF THE 2006 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES

ISBN: 1-4244-0167-4

Año de publicación: 2006

Páginas: 222-223

Congreso: 19th International Conference on Microelectronic Test Structures (ICMTS 2006)

Tipo: Aportación congreso