A comprehensive model to accurately calculate the gate capacitance and the leakage from DC to 100 MHz for ultra thin dielectrics
- Pantisano, L.
- Ramos, J.
- Serrano, E. San Andres
- Roussel, Ph. J.
- Sansen, W.
- Groeseneken, G.
ISBN: 1-4244-0167-4
Año de publicación: 2006
Páginas: 222-223
Congreso: 19th International Conference on Microelectronic Test Structures (ICMTS 2006)
Tipo: Aportación congreso