Evaluation of the Sensitivity of a COTS 90-nm SRAM Memory at Low Bias Voltage
- Antonio Clemente, Juan
- Hubert, Guillaume
- Franco, Francisco J.
- Villa, Francesca
- Baylac, Maud
- Mecha, Hortensia
- Velazco, Raoul
Book:
2016 16TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS)
ISBN: 978-1-5090-4366-8
Year of publication: 2016
Congress: 16th European Conference on Radiation and its Effects on Components and Systems (RADECS)
Type: Conference paper