Improving the fault tolerance of nanometric PLA designs
- Angiolini, Federico
- Ben Jamaa, M. Haykel
- Atienza, David
- Benini, Luca
- De Micheli, Giovanni
ISSN: 1530-1591
ISBN: 978-3-9810801-2-4
Année de publication: 2007
Pages: 570-571
Congreso: Design, Automation and Test in Europe Conference and Exhibition (DATE 07)
Type: Communication dans un congrès