SCANNING-TUNNELING-MICROSCOPY SCANNING ELECTRON-MICROSCOPY COMBINED INSTRUMENT

  1. ASENJO, A
  2. BUENDIA, A
  3. GOMEZRODRIGUEZ, JM
  4. BARO, AM
Journal:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

ISSN: 1071-1023

Year of publication: 1994

Volume: 12

Issue: 3

Pages: 1658-1661

Congress: 1993 International Conference on Scanning Tunneling Microscopy (STM 93)

Type: Conference paper

DOI: 10.1116/1.587256 GOOGLE SCHOLAR
Data source: WoS