A New EDAC Technique against Soft Errors based on Pulse Detectors

  1. Ruano, O.
  2. Reviriego, P.
  3. Maestro, J. A.
Collection de livres:
2008 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1-5

ISSN: 2163-5137

ISBN: 978-1-4244-1665-3

Année de publication: 2008

Pages: 1082-1087

Congreso: IEEE International Symposium on Industrial Electronics

Type: Communication dans un congrès