Further analysis of the statistical independence of the NIST SP 800-22 randomness tests
- Luengo, E.A.
- Olivares, B.A.
- Villalba, L.J.G.
- Hernandez-Castro, J.
Revue:
Applied Mathematics and Computation
ISSN: 0096-3003
Année de publication: 2023
Volumen: 459
Type: Article