Microstructure and mechanical properties of physical vapor deposited Cu/W nanoscale multilayers: Influence of layer thickness and temperature

  1. Monclús, M.A.
  2. Karlik, M.
  3. Callisti, M.
  4. Frutos, E.
  5. Llorca, J.
  6. Polcar, T.
  7. Molina-Aldareguía, J.M.
Journal:
Thin Solid Films

ISSN: 0040-6090

Year of publication: 2014

Volume: 571

Issue: P2

Pages: 275-282

Type: Conference paper

DOI: 10.1016/J.TSF.2014.05.044 GOOGLE SCHOLAR
Data source: Scopus