JOSÉ MARÍA
RICO GARCÍA
Investigador hasta 2014
JOSÉ MANUEL
LÓPEZ ALONSO
Profesor titular de universidad
Publicaciones en las que colabora con JOSÉ MANUEL LÓPEZ ALONSO (13)
2012
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Toy model to describe the effect of positional blocklike disorder in metamaterials composites
Journal of the Optical Society of America B: Optical Physics, Vol. 29, Núm. 1, pp. 53-67
2007
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High-resolution spatial-response measurements of optical nano-antennas in the visible
IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
2006
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Design of Fresnel lenses and binary-staircase kinoforms of low value of the aperture number
Optics Communications, Vol. 260, Núm. 2, pp. 454-461
2005
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Characterization of photonic crystal microcavities with manufacture imperfections
Optics Express, Vol. 13, Núm. 10, pp. 3802-3815
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Estimation of the influence of finite dielectric substrates on the far-field pattern of an array of metallic scatterers in the infrared
Infrared Physics and Technology, Vol. 46, Núm. 4, pp. 267-276
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FDTD analysis of nano-antenna structures with dispersive materials at optical frequencies
Proceedings of SPIE - The International Society for Optical Engineering
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Multivariate analysis of photonic crystal microcavities with fabrication defects
Proceedings of SPIE - The International Society for Optical Engineering
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Numerical artifacts in finite-difference time-domain algorithms analyzed by means of principal components
IEEE Transactions on Antennas and Propagation, Vol. 53, Núm. 9, pp. 2920-2927
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Optical antennas for nano-photonic applications
Nanotechnology
2004
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Characterization of FDTD artifacts and modes in photonic crystals
Proceedings of SPIE - The International Society for Optical Engineering
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Finite-difference time-domain simulation of low-F# fresnel zone plates coupled to IR antennas
Proceedings of SPIE - The International Society for Optical Engineering
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Photonic crystal characterization by FDTD and principal component analysis
Optics Express, Vol. 12, Núm. 10, pp. 2176-2186
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Spatial characterization of light detectors with nanometric resolution
Proceedings of SPIE - The International Society for Optical Engineering