AGUSTINA
ASENJO BARAHONA
Ikertzailea 2008-(e)ra arte
IEEE Computer Society
Washington, Estados UnidosIEEE Computer Society-ko ikertzaileekin lankidetzan egindako argitalpenak (1)
2008
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Calibration of coercive and stray fields of commercial magnetic force microscope probes
IEEE Transactions on Nanotechnology, Vol. 7, Núm. 3, pp. 245-250