Informática
Facultad
Instituto de Microelectrónica de Madrid
Madrid, EspañaPublicaciones en colaboración con investigadores/as de Instituto de Microelectrónica de Madrid (11)
2015
-
Interfacial effects on the tunneling magnetoresistance in L a0.7 S r0.3Mn O3/MgO/Fe tunneling junctions
Physical Review B - Condensed Matter and Materials Physics, Vol. 92, Núm. 9
2013
-
Sub-bandgap external quantum efficiency in Ti implanted Si heterojunction with intrinsic thin layer cells
Japanese Journal of Applied Physics, Vol. 52, Núm. 12
2005
-
Multi-wavelength transmittance photoplethysmography with near infrared laser diodes during exercise
Progress in Biomedical Optics and Imaging - Proceedings of SPIE
-
Multi-wavelength transmittance photoplethysmography with near infrared laser diodes during exercise
Optics InfoBase Conference Papers
2004
-
Oxygen saturation measurements in athletes attaining maximal exertion conditions
Conference Record - IEEE Instrumentation and Measurement Technology Conference
-
Strain-inhomogeneity effect on magnetization and low-temperature resistivity of epitaxial Fe(0 0 1) thin films
Journal of Magnetism and Magnetic Materials, Vol. 268, Núm. 1-2, pp. 24-28
-
Transmittance photoplethysmography and pulse oximetry with near infrared laser diodes
Conference Record - IEEE Instrumentation and Measurement Technology Conference
2001
-
Correlation between magnetic and transport properties in nanocrystalline Fe thin films: A grain-boundary magnetic disorder effect
Physical Review B - Condensed Matter and Materials Physics, Vol. 64, Núm. 22, pp. 2244311-2244314
-
Correlation between magnetic and transport properties in nanocrystalline Fe thin films: A grain-boundary magnetic disorder effect
Physical Review B - Condensed Matter and Materials Physics, Vol. 64, Núm. 22
-
Effect of anisotropy on the vortex liquid dissipation in YBa2Cu3O7-δ thin films
Journal of Alloys and Compounds
-
Electron-electron interaction and weak localization effects in badly metallic SrRuO3
Physical Review B - Condensed Matter and Materials Physics, Vol. 63, Núm. 5