Effect of thermal annealing on Te precipitates in CdTe wafers studied by Raman scattering and cathodoluminescence

  1. Sochinskii, N.V.
  2. Serrano, M.D.
  3. Diéguez, E.
  4. Agulló-Rueda, F.
  5. Pal, U.
  6. Piqueras, J.
  7. Fernández, P.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 1995

Volume: 77

Issue: 6

Pages: 2806-2808

Type: Article

DOI: 10.1063/1.358687 GOOGLE SCHOLAR
Data source: Scopus