Fe/Si(111) interface formation studied by photoelectron diffraction
- Avila, J.
- Mascaraque, A.
- Teodorescu, C.
- Michel, E.G.
- Asensio, M.C.
Journal:
Surface Science
ISSN: 0039-6028
Year of publication: 1997
Volume: 377-379
Pages: 856-860
Type: Article