Goodness of fit tests with misclassified data based on φ-divergences

  1. Pardo, L.
  2. Zografos, K.
Journal:
Biometrical Journal

ISSN: 0323-3847

Year of publication: 2000

Volume: 42

Issue: 2

Pages: 223-237

Type: Article

DOI: 10.1002/(SICI)1521-4036(200005)42:2<223::AID-BIMJ223>3.0.CO;2-T GOOGLE SCHOLAR
Data source: Scopus