Reliability-aware design for nanometer-scale devices

  1. Atienza, D.
  2. De Micheli, G.
  3. Benini, L.
  4. Ayala, J.L.
  5. Del Valle, P.G.
  6. DeBole, M.
  7. Narayanan, V.
Proceedings:
Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

ISBN: 9781424419227

Year of publication: 2008

Pages: 549-554

Type: Conference paper

DOI: 10.1109/ASPDAC.2008.4484011 GOOGLE SCHOLAR
Data source: Scopus