Reliability-aware design for nanometer-scale devices
- Atienza, D.
- De Micheli, G.
- Benini, L.
- Ayala, J.L.
- Del Valle, P.G.
- DeBole, M.
- Narayanan, V.
Aktak:
Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
ISBN: 9781424419227
Argitalpen urtea: 2008
Orrialdeak: 549-554
Mota: Biltzar ekarpena