Evaluation of the sensitivity of a COTS 90-nm SRAM memory at low bias voltage
- Clemente, J.A.
- Hubert, G.
- Franco, F.J.
- Villa, F.
- Baylac, M.
- Mecha, H.
- Velazco, R.
Actes de conférence:
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
ISBN: 9781509043668
Année de publication: 2016
Volumen: 2016-September
Pages: 1-4
Type: Communication dans un congrès
