Single events in a COTS soft-error free SRAM at low bias voltage induced by 15-MeV neutrons

  1. Clemente, J.A.
  2. Franco, F.J.
  3. Villa, F.
  4. Baylac, M.
  5. Ramos, P.
  6. Vargas, V.
  7. Mecha, H.
  8. Agapito, J.A.
  9. Velazco, R.
Journal:
IEEE Transactions on Nuclear Science

ISSN: 0018-9499

Year of publication: 2016

Volume: 63

Issue: 4

Pages: 2072-2079

Type: Article

DOI: 10.1109/TNS.2016.2522819 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus