Neutron-induced single events in a COTS soft-error free SRAM at low bias voltage

  1. Clemente, J.A.
  2. Franco, F.J.
  3. Villa, F.
  4. Baylac, M.
  5. Ramos, P.
  6. Vargas, V.
  7. Mecha, H.
  8. Agapito, J.A.
  9. Velazco, R.
Actas:
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

ISBN: 9781509002313

Año de publicación: 2015

Volumen: 2015-December

Tipo: Aportación congreso

DOI: 10.1109/RADECS.2015.7365640 GOOGLE SCHOLAR
Fuente de los datos: Scopus