High-level allocation to minimize internal hardware wastage

  1. Molina, M.C.
  2. Mendias, J.M.
  3. Hermida, R.
Proceedings:
Proceedings -Design, Automation and Test in Europe, DATE

ISSN: 1530-1591

Year of publication: 2003

Pages: 264-269

Type: Conference paper

DOI: 10.1109/DATE.2003.1253618 GOOGLE SCHOLAR