Comparison of the susceptibility to soft errors of SRAM-Based FPGA error correction codes implementations

  1. Liu, S.
  2. Sorrenti, G.
  3. Reviriego, P.
  4. Casini, F.
  5. Maestro, J.A.
  6. Alderighi, M.
  7. Mecha, H.
Revue:
IEEE Transactions on Nuclear Science

ISSN: 0018-9499

Année de publication: 2012

Volumen: 59

Número: 3 PART 2

Pages: 619-624

Type: Article

DOI: 10.1109/TNS.2012.2193417 GOOGLE SCHOLAR
La source de données: Scopus