UV and visible Raman scattering of ultraheavily Ti implanted Si layers for intermediate band formation

  1. Pastor, D.
  2. Olea, J.
  3. Del Prado, A.
  4. García-Hemme, E.
  5. Mártil, I.
  6. González-Díaz, G.
  7. Ibáñez, J.
  8. Cuscó, R.
  9. Artús, L.
Journal:
Semiconductor Science and Technology

ISSN: 0268-1242,  1361-6641

Year of publication: 2011

Volume: 26

Issue: 11

Type: Article

DOI: 10.1088/0268-1242/26/11/115003 GOOGLE SCHOLAR
Data source: Scopus