Advantages and disadvantages of PIXE/PIGE, XRF and EDX spectrometries applied to archaeometric characterisation of glasses

  1. Carmona, N.
  2. Ortega-Feliu, I.
  3. Gómez-Tubío, B.
  4. Villegas, M.A.
Revue:
Materials Characterization

ISSN: 1044-5803

Année de publication: 2010

Volumen: 61

Número: 2

Pages: 257-267

Type: Article

DOI: 10.1016/J.MATCHAR.2009.12.006 GOOGLE SCHOLAR
La source de données: Scopus