Defect assessment of Mg-doped GaN by beam injection techniques

  1. Díaz-Guerra, C.
  2. Piqueras, J.
  3. Castaldini, A.
  4. Cavallini, A.
  5. Polenta, L.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 2003

Volumen: 94

Número: 12

Pages: 7470-7475

Type: Article

DOI: 10.1063/1.1628832 GOOGLE SCHOLAR