DC characterization of fully ion-implanted p-n junctions into semi-insulating InP

  1. Martin, J.M.
  2. Sanchez, S.G.
  3. Martil, I.
  4. Gonzalez-Diaz, G.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 1996

Volume: 43

Issue: 3

Pages: 396-401

Type: Article

DOI: 10.1109/16.485652 GOOGLE SCHOLAR

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