Deep-level transient spectroscopy and electrical characterization of ion-implanted p-n junctions into undoped InP
- Martin, J.M.
- García, S.
- Mártil, I.
- González-Díaz, G.
- Castán, E.
- Dueñas, S.
ISSN: 0021-8979
Année de publication: 1995
Volumen: 78
Número: 9
Pages: 5325-5330
Type: Article