An undergraduate experiment: The determination of the structure of Ge and Si based bipolar transistors

  1. Mártil, I.
  2. Martínez, F.L.
  3. Lucía, M.L.
Revue:
International Journal of Electrical Engineering Education

ISSN: 0020-7209

Année de publication: 1997

Volumen: 34

Número: 1

Pages: 16-27

Type: Article

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La source de données: Scopus