An undergraduate experiment: The determination of the structure of Ge and Si based bipolar transistors

  1. Mártil, I.
  2. Martínez, F.L.
  3. Lucía, M.L.
Revista:
International Journal of Electrical Engineering Education

ISSN: 0020-7209

Ano de publicación: 1997

Volume: 34

Número: 1

Páxinas: 16-27

Tipo: Artigo

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Fonte de datos: Scopus