Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti 3SiC 2 determined by polarized x-ray spectroscopy and Seebeck measurements
- Magnuson, M.
- Mattesini, M.
- Nong, N.V.
- Eklund, P.
- Hultman, L.
ISSN: 1098-0121, 1550-235X
Argitalpen urtea: 2012
Alea: 85
Zenbakia: 19
Mota: Artikulua