Hydrogen-related hole capture and positive charge build up in buried oxides

  1. Rivera, A.
  2. Van Veen, A.
  3. Schut, H.
  4. De Nijs, J.M.M.
  5. Balk, P.
Journal:
Solid-State Electronics

ISSN: 0038-1101

Year of publication: 2002

Volume: 46

Issue: 11

Pages: 1775-1785

Type: Conference paper

DOI: 10.1016/S0038-1101(02)00150-8 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus