New developments in charge pumping measurements on thin stacked dielectrics

  1. Toledano-Luque, M.
  2. Degraeve, R.
  3. Zahid, M.B.
  4. Pantisano, L.
  5. San Andrés, E.
  6. Groeseneken, G.
  7. De Gendt, S.
Revue:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Année de publication: 2008

Volumen: 55

Número: 11

Pages: 3184-3191

Type: Article

DOI: 10.1109/TED.2008.2005129 GOOGLE SCHOLAR
La source de données: Scopus