Aberration-corrected STEM - More than just higher resolution

  1. Pennycook, S.J.
  2. Chisholm, M.F.
  3. Lupini, A.R.
  4. Peng, Y.
  5. Varela, M.
  6. Van Benthem, K.
  7. Borisevich, A.
  8. De Jonge, N.
  9. Oxley, M.P.
Journal:
Microscopy and Microanalysis

ISSN: 1431-9276,  1435-8115

Year of publication: 2006

Volume: 12

Issue: SUPPL. 2

Pages: 132-133

Type: Conference paper

DOI: 10.1017/S1431927606069650 GOOGLE SCHOLAR
Data source: Scopus