Sub-nanometer resolution of an organic semiconductor crystal surface using friction force microscopy in water
- Pimentel, C.
- Varghese, S.
- Yoon, S.-J.
- Park, S.Y.
- Gierschner, J.
- Gnecco, E.
- Pina, C.M.
ISSN: 1361-648X, 0953-8984
Datum der Publikation: 2016
Ausgabe: 28
Nummer: 13
Art: Artikel