Sub-nanometer resolution of an organic semiconductor crystal surface using friction force microscopy in water

  1. Pimentel, C.
  2. Varghese, S.
  3. Yoon, S.-J.
  4. Park, S.Y.
  5. Gierschner, J.
  6. Gnecco, E.
  7. Pina, C.M.
Journal:
Journal of Physics Condensed Matter

ISSN: 1361-648X,  0953-8984

Year of publication: 2016

Volume: 28

Issue: 13

Type: Article

DOI: 10.1088/0953-8984/28/13/134002 GOOGLE SCHOLAR
Data source: Scopus