Electronic speckle pattern interferometry technique for the measurement of complex mechanical structures for aero-spatial applications

  1. Restrepo, R.
  2. Uribe-Patarroyo, N.
  3. Garranzo, D.
  4. Pintado, J.M.
  5. Frovel, M.
  6. Belenguer, T.
Konferenzberichte:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819476708

Datum der Publikation: 2010

Ausgabe: 7387

Art: Konferenz-Beitrag

DOI: 10.1117/12.870673 GOOGLE SCHOLAR
Datenquelle: Scopus