In-line detection and evaluation of surface defects on thin metallic wires

  1. Martínez-Antón, J.C.
  2. Siegmann, P.
  3. Sanchez-Brea, L.M.
  4. Bernabeu, E.
  5. Gómez-Pedrero, J.A.
  6. Canabal, H.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

Year of publication: 2001

Volume: 4399

Pages: 27-34

Type: Conference paper

DOI: 10.1117/12.445586 GOOGLE SCHOLAR
Data source: Scopus