In-line detection and evaluation of surface defects on thin metallic wires

  1. Martínez-Antón, J.C.
  2. Siegmann, P.
  3. Sanchez-Brea, L.M.
  4. Bernabeu, E.
  5. Gómez-Pedrero, J.A.
  6. Canabal, H.
Actas:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

Ano de publicación: 2001

Volume: 4399

Páxinas: 27-34

Tipo: Achega congreso

DOI: 10.1117/12.445586 GOOGLE SCHOLAR
Fonte de datos: Scopus