Comparison between optical techniques and confocal microscopy for defect detection on thin wires

  1. Siegmann, P.
  2. Sanchez-Brea, L.M.
  3. Martinez-Anton, J.C.
  4. Bernabeu, E.
Journal:
Applied Surface Science

ISSN: 0169-4332

Year of publication: 2004

Volume: 238

Issue: 1-4 SPEC. ISS.

Pages: 375-379

Type: Conference paper

DOI: 10.1016/J.APSUSC.2004.05.240 GOOGLE SCHOLAR
Data source: Scopus