Atomic resolution STEM-EELS studies of defects and local structural distortions in oxide interfaces
- Sánchez-Santolino, G.
- Roldan, M.A.
- Qiao, Q.
- Begon-Lours, L.
- Frechero, M.A.
- Salafranca, J.
- Mishra, R.
- Leon, C.
- Pantelides, S.T.
- Pennycook, S.J.
- Villegas, J.E.
- Santamaria, J.
- Varela, M.
ISSN: 1435-8115, 1431-9276
Datum der Publikation: 2017
Ausgabe: 23
Seiten: 372-373
Art: Note