Atomic resolution STEM-EELS studies of defects and local structural distortions in oxide interfaces

  1. Sánchez-Santolino, G.
  2. Roldan, M.A.
  3. Qiao, Q.
  4. Begon-Lours, L.
  5. Frechero, M.A.
  6. Salafranca, J.
  7. Mishra, R.
  8. Leon, C.
  9. Pantelides, S.T.
  10. Pennycook, S.J.
  11. Villegas, J.E.
  12. Santamaria, J.
  13. Varela, M.
Revue:
Microscopy and Microanalysis

ISSN: 1435-8115,  1431-9276

Année de publication: 2017

Volumen: 23

Pages: 372-373

Type: Note

DOI: 10.1017/S1431927617002549 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus