Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data
- Balakrishnan, N.
- Castilla, E.
- Martín, N.
- Pardo, L.
ISSN: 1435-926X, 0026-1335
Year of publication: 2019
Volume: 82
Issue: 8
Pages: 991-1019
Type: Article