Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N

1. Rigutti, L.
2. Mancini, L.
3. Hernández-Maldonado, D.
4. Lefebvre, W.
5. Giraud, E.
6. Butté, R.
7. Carlin, J.F.
8. Grandjean, N.
9. Blavette, D.
10. Vurpillot, F.