Multi-microscopy study of the influence of stacking faults and three-dimensional In distribution on the optical properties of m-plane InGaN quantum wells grown on microwire sidewalls

1. Mancini, L.
2. Hernández-Maldonado, D.
3. Lefebvre, W.
4. Houard, J.
5. Blum, I.
6. Vurpillot, F.
7. Eymery, J.
8. Durand, C.
9. Tchernycheva, M.
10. Rigutti, L.