Defect inspection by an active 3D multiresolution technique

  1. Vargas, J.
  2. Quiroga, J.A.
Aktak:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819473981

Argitalpen urtea: 2008

Alea: 7155

Mota: Biltzar ekarpena

DOI: 10.1117/12.814516 GOOGLE SCHOLAR
Datuen iturria: Scopus