Three-dimensional measurement of microchips using structured light techniques

  1. Vargas, J.
  2. Koninckx, T.
  3. Quiroga, J.A.
  4. Gool, L.V.
Aldizkaria:
Optical Engineering

ISSN: 0091-3286,  1560-2303

Argitalpen urtea: 2008

Alea: 47

Zenbakia: 5

Mota: Artikulua

DOI: 10.1117/1.2919726 GOOGLE SCHOLAR
Datuen iturria: Scopus