One-layer vs. Two-layer som in the context of outlier identification: A simulation study
- Valverde Castilla, G.A.
- Mira McWilliams, J.M.
- González-Pérez, B.
Aldizkaria:
Applied Sciences (Switzerland)
ISSN: 2076-3417
Argitalpen urtea: 2021
Alea: 11
Zenbakia: 14
Mota: Artikulua