One-layer vs. Two-layer som in the context of outlier identification: A simulation study

  1. Valverde Castilla, G.A.
  2. Mira McWilliams, J.M.
  3. González-Pérez, B.
Revue:
Applied Sciences (Switzerland)

ISSN: 2076-3417

Année de publication: 2021

Volumen: 11

Número: 14

Type: Article

DOI: 10.3390/APP11146241 GOOGLE SCHOLAR lock_openAccès ouvert editor